Noninvasive determination of optical lever sensitivity in atomic force microscopy
نویسندگان
چکیده
منابع مشابه
Noninvasive determination of optical lever sensitivity in atomic force microscopy
Atomic force microscopes typically require knowledge of the cantilever spring constant and optical lever sensitivity in order to accurately determine the force from the cantilever deflection. In this study, we investigate a technique to calibrate the optical lever sensitivity of rectangular cantilevers that does not require contact to be made with a surface. This noncontact approach utilizes th...
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Force studies using atomic force microscopy generally require knowledge of the cantilever spring constants and the optical lever sensitivity. The traditional method of evaluating the optical lever sensitivity by pressing the tip against a hard surface can damage the tip, especially sharp ones. Here a method is shown to calculate the sensitivity without having to bring the tip into contact. Inst...
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In this paper, the non-linear dynamic response of rectangular atomic force microscopy in tapping mode is considered. The effect of cantilever’s geometrical parameters (e.g., cantilever length, width, thickness, tip length and the angle between the cantilever and the sample's surface in liquid environment has been studied by taking into account the interaction forces. Results indicate that the r...
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Atomic force microscopy (AFM) is a three-dimensional topographic technique with a high atomic resolution to measure surface roughness. AFM is a kind of scanning probe microscope, and its near-field technique is based on the interaction between a sharp tip and the atoms of the sample surface. There are several methods and many ways to modify the tip of the AFM to investigate surface properties, ...
متن کاملOptical lever calibration in atomic force microscope with a mechanical lever.
A novel method that uses a small mechanical lever has been developed to directly calibrate the lateral sensitivity of the optical lever in the atomic force microscope (AFM). The mechanical lever can convert the translation into a nanoscale rotation angle with a flexible hinge that provides an accurate conversion between the photodiode voltage output and torsional angle of a cantilever. During t...
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ژورنال
عنوان ژورنال: Review of Scientific Instruments
سال: 2006
ISSN: 0034-6748,1089-7623
DOI: 10.1063/1.2162455